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Related Experiment Video

Updated: Jun 25, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
08:01

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Published on: November 21, 2019

Method to deterministically study photonic nanostructures in different experimental instruments.

B H Husken1, L A Woldering, C Blum

  • 1Center for Nanophotonics, FOM Institute for Atomic and Molecular Physics (AMOLF), P.O. Box 41883, 1009 DB Amsterdam, The Netherlands.

Journal of Microscopy
|February 7, 2009
PubMed
Summary

This study introduces a novel method for locating and studying individual nanostructures using their natural surroundings as markers. This technique enables detailed analysis of photonic structures without artificial aids, benefiting self-assembled materials.

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Optics

Background:

  • Studying individual nanostructures is crucial for understanding their properties.
  • Current methods often rely on artificial markers, limiting their application to known or conductive samples.
  • Precisely locating and analyzing self-assembled or non-conductive nanostructures remains a challenge.

Purpose of the Study:

  • To develop an experimental method for recovering and studying single, deterministically fabricated nanostructures without artificial markers.
  • To enable the investigation of photonic structures using intrinsic geometric features for identification.
  • To demonstrate the applicability of the method across various experimental instruments and sample types.

Main Methods:

  • Fabrication of nanostructures accompanied by detailed mapping of their spatial surroundings using micrographs at decreasing magnifications.

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Last Updated: Jun 25, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
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Published on: November 21, 2019

Implementation of a Reference Interferometer for Nanodetection
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Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

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Published on: July 21, 2018

  • Utilizing intrinsic geometric features from these maps as natural markers for identification.
  • Employing cross-correlation techniques to align and analyze images from different instruments (e.g., SEM and optical microscopy).

    • Main Results:

    • Successfully demonstrated a method to locate and study individual nanostructures without artificial markers.
    • Probed surface cavities on a silica opal photonic crystal using a focused ion beam workstation, scanning electron microscope, wide field optical microscope, and confocal microscope.
    • Obtained both structural and optical reflectivity data from the same nanostructure, validating the technique's versatility.

    Conclusions:

    • The developed method allows for the precise recovery and analysis of nanostructures using their inherent features as markers.
    • This approach is particularly valuable for studying samples with unknown structures, such as self-assembled materials, and is not limited to conductive samples.
    • The technique facilitates multi-modal characterization, enabling comprehensive studies of nanostructure properties.