X-ray Diffraction of Biological Samples
Determination of Crystal Structures
X-ray Imaging
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P Sarin1, R P Haggerty, W Yoon
1Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, IL 61801, USA.
A new curved image plate (CIP) detector offers high-resolution X-ray diffraction (XRD) analysis with rapid data acquisition. This advanced detector enables efficient study of kinetic processes in materials science.
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