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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jun 24, 2026

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
09:51

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Published on: April 22, 2013

Near-grain-boundary characterization by atomic force microscopy.

A K Pramanick1, A Sinha, G V S Sastry

  • 1MST Division, National Metallurgical Laboratory, Jamshedpur 831007, India. pramanick@nmlindia.org

Ultramicroscopy
|March 24, 2009
PubMed
Summary
This summary is machine-generated.

Atomic force microscopy (AFM) effectively characterized nickel grain boundaries. This technique revealed distinct crystallographic relationships, including plane matching and a specific Coincidence Site Lattice (CSL Sigma=9) relation, under different processing conditions.

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Area of Science:

  • Materials Science
  • Surface Science
  • Crystallography

Background:

  • Understanding near-grain boundary characteristics is crucial for material properties.
  • Atomic Force Microscopy (AFM) offers high-resolution surface investigation capabilities.

Purpose of the Study:

  • To characterize near-grain boundary regions in commercial purity-grade nickel.
  • To evaluate the suitability of AFM for high-resolution crystallographic analysis of grain boundaries.
  • To establish grain-boundary relations under different material processing conditions.

Main Methods:

  • Utilized Atomic Force Microscopy (AFM) for high-resolution surface characterization.
  • Investigated commercial purity-grade nickel samples processed via cold rolling and annealing.
  • Analyzed thermally etched nickel samples without prior cold rolling.

Main Results:

  • AFM demonstrated high suitability for detailed surface and crystallographic analysis.
  • AFM-derived crystallographic data showed excellent agreement with standard reference data.
  • Two distinct grain-boundary relationships were identified: plane matching and Coincidence Site Lattice (CSL Sigma=9).

Conclusions:

  • AFM is a powerful technique for elucidating grain-boundary structures and relationships.
  • The study successfully established specific crystallographic relations (plane matching and CSL Sigma=9) for nickel under varied processing histories.