Related Experiment Video

Updated: Jun 24, 2026

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries
09:51

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries

Published on: April 22, 2013

Near-grain-boundary characterization by atomic force microscopy

A K Pramanick1, A Sinha, G V S Sastry

  • 1MST Division, National Metallurgical Laboratory, Jamshedpur 831007, India. pramanick@nmlindia.org

Ultramicroscopy
|March 24, 2009
PubMed

More Related Videos

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid08:58

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

Published on: December 2, 2022

Quantitative Hardness Measurement by Instrumented AFM-indentation08:21

Quantitative Hardness Measurement by Instrumented AFM-indentation

Published on: November 22, 2016

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...