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Defect modes in a periodic structure with chiral layers

Vladimir R Tuz1, Vadim B Kazansky

  • 1Department of Theoretical Radio Physics, Kharkov National University, Svobody Square 4, Kharkov, Ukraine. tvr@vega.kharkov.ua

Journal of the Optical Society of America. A, Optics, Image Science, and Vision
|April 3, 2009
PubMed
Summary

This study investigates defect effects in layered optical materials using a transfer-matrix method. It analyzes how structural defects impact electromagnetic properties for potential applications in optical devices.

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