Quantifying surface modification events from scanning force microscopy images

Scanning force microscopy (SFM) is widely used to monitor surfaces and surface modification processes. Some surface modification processes involve the addition (or removal) of discrete entities to (or from) a surface in circumstances where the absolute number of entities is related to some aspect of the process. A two-dimensional surface characterisation parameter - the surface area ratio (SAR) - was previously developed as a means of quantifying such modification and can be readily obtained from SFM images. Simulations have shown that the SAR parameter is superior for quantification purposes to conventional surface roughness parameters such as roughness average S(a), the area equivalent of R(a). Key features of SAR are as follows: its linear dependence with coverage; dependence of linearity slope on coverage mechanism; and its independence from the form, waviness or roughness of the underlying surface. A further advantage of this method is its simplicity given that the SAR parameter is readily obtained from SFM images. Simulations of adsorption onto flat surfaces have been validated using SFM images of polystyrene spheres adsorbed onto mica.