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Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping

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Randomized benchmarking and process tomography for gate errors in a solid-state qubit.

J M Chow¹, J M Gambetta, L Tornberg

¹Department of Physics, Yale University, New Haven, Connecticut 06520, USA.

Physical Review Letters

|April 28, 2009

Summary

This summary is machine-generated.

We measured single-qubit gate errors in superconducting qubits using quantum process tomography and randomized benchmarking. Randomized benchmarking showed a minimum average gate error of 1.1%, limited by qubit decoherence.

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Area of Science:

Quantum computing
Superconducting circuits
Quantum information science

Background:

Accurate single-qubit gates are crucial for scalable quantum computation.
Superconducting qubits are a leading platform for building quantum computers.
Quantifying gate errors is essential for understanding and improving qubit performance.

Purpose of the Study:

To measure and compare single-qubit gate errors in superconducting qubits.
To evaluate the effectiveness of different experimental techniques for error quantification.
To identify the primary factors limiting gate fidelity.

Main Methods:

Quantum process tomography (QPT) was employed to characterize gate performance.
Randomized benchmarking (RB) was used to estimate average gate errors.
A double pi pulse experiment provided an additional method for error assessment.

Main Results:

Randomized benchmarking yielded a minimum average gate error of 1.1% +/- 0.3%.
Gate fidelity demonstrated a simple exponential decay with an increasing number of gates.
Qubit decoherence was identified as the dominant factor limiting gate fidelity.

Conclusions:

The study provides precise measurements of single-qubit gate errors for superconducting qubits.
Qubit decoherence fundamentally limits gate fidelity in current superconducting qubit systems.
The findings align with theoretical predictions regarding decoherence-induced limitations.