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Updated: Jun 23, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Discussion to the angular aperture narrowing behavior inside AOTF crystal

B Xue, K Xu, H Yamamoto

    Optics Express
    |April 29, 2009
    PubMed

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