Confocal Fluorescence Microscopy
Phase Contrast and Differential Interference Contrast Microscopy
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Ivan Kassamakov1, Kalle Hanhijärvi, Imad Abbadi
1Helsinki University of Technology, Micronova, P.O.B. 3500, FIN-02015 TKK, Finland. ivan.kassamakov@helsinki.fi
A novel supercontinuum light source enhances scanning white-light interferometry for precise microelectromechanical system measurements. Its high intensity and modulation capabilities offer potential for advanced dynamic and low-reflectivity sample analysis.
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