High-angle annular dark field scanning transmission electron microscopy on carbon-based functional polymer systems

Erwan Sourty1, Svetlana van Bavel, Kangbo Lu

  • 1Laboratory of Materials and Interface Chemistry and Soft-Matter CryoTEM Research Unit, Eindhoven University of Technology, PO Box 513, NL-5600 MB Eindhoven, The Netherlands.

Summary

High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) reveals nanoscale details in carbon-based polymers, outperforming conventional transmission electron microscopy (CTEM) for interface and domain analysis.

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