Related Experiment Video
Updated: Jun 22, 2026
09:41
Bulk and Thin Film Synthesis of Compositionally Variant Entropy-stabilized Oxides
Published on: May 29, 2018
Optical functions of (x)GeO2:(1-x)SiO2 films determined by multi-sample and multi-angle spectroscopic ellipsometry
Optics Express
|June 5, 2009
Summary
This study fabricates germanium dioxide-silicon dioxide (GeO2:SiO2) thin films using sol-gel methods. Spectroscopic ellipsometry reveals their optical properties, enabling prediction of refractive indices for optics and photonics applications.
Area of Science:
- Materials Science
- Optics and Photonics
- Ceramic Engineering
Background:
- Germanium dioxide-silicon dioxide (GeO2:SiO2) is a key binary ceramic material.
- Understanding its optical dispersion is crucial for optics and photonics.
- Sol-gel fabrication offers a versatile route for thin film synthesis.
Purpose of the Study:
- To fabricate GeO2:SiO2 thin films with varying compositions (0 ≤ x ≤ 0.4).
- To accurately determine the optical dispersion relationship of these films.
- To develop a predictive model for refractive indices based on composition.
Main Methods:
- Sol-gel technique for thin film fabrication.
- Spectroscopic ellipsometry (SE) using multi-sample and multi-angle measurements.
- Sellmeier model application for optical dispersion analysis.
Main Results:
- Homogeneous and amorphous GeO2:SiO2 films were successfully produced.
- A reliable method for creating a dispersion-composition surface was established.
- Optical dispersion properties were characterized from 210 to 1700 nm.
- Composition-dependent dispersion parameters, material dispersion coefficient, and zero-dispersion wavelength were quantified.
Conclusions:
- The Sellmeier model accurately describes the optical dispersion of GeO2:SiO2 films.
- The developed method allows for visualization and prediction of refractive indices.
- Composition significantly influences the optical dispersion characteristics of these films.
Related Concept Videos
01:10X-ray Diffraction of Biological Samples
X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
02:24Properties of Enantiomers and Optical Activity
It is essential to understand the difference between chiral and achiral interactions and the implications thereof in optical activity and their applications. Just as our feet, which are chiral, interact uniquely with chiral objects, such as a pair of shoes, but identically with achiral socks, enantiomers of a molecule exhibit different properties only when they interact with other chiral media. An example of a significant implication from this facet is the phenomenon known as optical activity,...