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Updated: Jun 22, 2026

Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
Published on: April 13, 2016
Synchrotron radiation hardness studies of PILATUS II
B A Sobott1, Ch Broennimann, E F Eikenberry
1School of Physics, The University of Melbourne, Melbourne, Victoria 3010, Australia. sbryn@physics.unimelb.edu.au
Abstract:
A synchrotron beam has been used to investigate the radiation tolerance of a PILATUS II module. It has been demonstrated that radiation-induced threshold shifts become significant above 30 Mrad. Individual adjustment of pixel thresholds after irradiation enabled retention of standard behaviour in excess of 40 Mrad. This implies that a module can be continuously irradiated for in excess of 40 days at an individual pixel count rate of 10(6) counts s(-1).
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