Atomic Force Microscopy
Mass Analyzers: Common Types
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Updated: Jun 21, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Holger Müller1, Sheng-wey Chiow, Sven Herrmann
1Department of Physics, University of California, Berkeley, California 94720-7300, USA. hm@berkeley.edu
This study integrates Bloch oscillations and Bragg diffraction into atom interferometers for enhanced sensitivity. This novel approach improves measurement precision and opens new avenues for applications like gravitational wave sensing.
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