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Light Enhanced Hydrofluoric Acid Passivation: A Sensitive Technique for Detecting Bulk Silicon Defects
Published on: January 4, 2016
J R Ackerhalt1, H W Galbraith, J C Goldstein
1Los Alamos National Laboratory, Box 1663, Los Alamos, New Mexico 87545, USA.
The v(3) ladder is the primary cause of self-focusing in sulfur hexafluoride (SF(6)). This finding, based on a vibrational model, aligns with experimental data and improves understanding of nonlinear optical phenomena.
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