Updated: Jun 20, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
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Researchers developed an optically controlled reflection modulator using GaAs-AlGaAs n-i-p-i and multiple-quantum-well structures. This device achieves 60% modulation with low control power, showing potential for optical information processing.
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