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Multilayer system for a high-precision surface plasmon resonance sensor.

K Matsubara, S Kawata, S Minami

|September 18, 2009

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This study introduces a multilayer surface plasmon resonance (SPR) system for enhanced chemical sensing. The novel design significantly reduces absorption peak widths, improving refractive index measurement resolution for high-precision applications.

Area of Science:

Optoelectronics
Nanotechnology
Chemical Sensing

Background:

Surface Plasmon Resonance (SPR) is a label-free optical technique used for detecting changes in refractive index.
Conventional SPR sensors, often based on the Kretschmann geometry, face limitations in resolution due to absorption peak width.
High-precision chemical sensing requires improved resolution in refractive index measurements.

Purpose of the Study:

To design and demonstrate a multilayer SPR system for enhanced chemical sensor applications.
To reduce the absorption peak width in SPR measurements for higher resolution.
To investigate the impact of an additional layer on SPR performance.

Main Methods:

Utilized a multilayer system by adding a layer to the conventional Kretschmann geometry.

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Employed Fresnel's formulas and multiple-reflectance theory for theoretical calculations.

Measured the angular distribution of reflectance from a thin metal film in contact with a sample.

Main Results:

Achieved significant reduction in absorption peak widths, approximately one third of conventional Kretschmann geometry.
Demonstrated that optimizing the thickness of the additional layer is crucial for peak width reduction.
Experimental results validated the feasibility and effectiveness of the proposed multilayer SPR system.

Conclusions:

The developed multilayer SPR system offers a pathway to significantly enhance the resolution of refractive index measurements.
This advancement holds promise for developing more sensitive and precise chemical sensors.
The findings provide a foundation for further optimization of SPR-based sensing technologies.