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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences01:20

Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences

Inductively coupled plasma–mass spectrometry (ICP–MS) is a highly selective and sensitive technique for accurate elemental analysis. Though the analysis of ICP–MS mass spectra is comparatively straightforward, it is affected by spectroscopic and non-spectroscopic interferences. Spectroscopic interferences arise when the plasma contains ionic species with an m/z value the same as the analyte ion. Spectroscopic interference can be categorized as isobaric, polyatomic ions, and refractory oxide ion...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Published on: December 20, 2016

Amplitude-modulated interferometry.

A Brunfeld, L Singher, J Shamir

    Optics Letters
    |September 22, 2009
    PubMed
    Summary
    This summary is machine-generated.

    Modulating interfering amplitudes in a double-beam interferometer enables high-precision measurements insensitive to reflectivity changes. This amplitude modulation method outperforms phase-shifting interferometry, offering faster and simpler implementation for optical measurements.

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    Area of Science:

    • Optical Physics
    • Metrology
    • Interferometry

    Background:

    • Interferometry is crucial for high-precision measurements.
    • Phase-shifting interferometry is a common technique but has limitations.
    • Reflectivity variations can impact measurement accuracy.

    Purpose of the Study:

    • To introduce a novel amplitude modulation technique for interferometry.
    • To demonstrate superior performance compared to phase-shifting methods.
    • To enhance measurement precision and robustness.

    Main Methods:

    • Implementing specific modulating procedures on interfering amplitudes in a double-beam interferometer.
    • Utilizing amplitude modulation instead of phase modulation.
    • Developing a system for faster and easier implementation.

    Main Results:

    • Achieved high-precision measurements.
    • Demonstrated insensitivity to changes in reflectivity.
    • Showcased superior performance over phase-shifting interferometry.
    • Enabled faster and simpler system operation.

    Conclusions:

    • Amplitude modulation in interferometry offers significant advantages.
    • The proposed method enhances precision and reduces sensitivity to reflectivity.
    • This technique presents a more practical and efficient alternative for optical measurements.