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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Related Experiment Video

Updated: Jun 20, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Interferometric laser profilometer for rough surfaces.

|September 24, 2009

Summary

This summary is machine-generated.

A novel synthetic-wavelength interferometer uses two laser wavelengths to accurately measure surface topography. This method provides absolute range information, enabling surface profiling beyond the limits of conventional interferometry for rough surfaces.

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Experiments on Ultrasonic Lubrication Using a Piezoelectrically-assisted Tribometer and Optical Profilometer

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Last Updated: Jun 20, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Experiments on Ultrasonic Lubrication Using a Piezoelectrically-assisted Tribometer and Optical Profilometer

Experiments on Ultrasonic Lubrication Using a Piezoelectrically-assisted Tribometer and Optical Profilometer

Published on: September 28, 2015

Area of Science:

Optics and Photonics
Metrology and Measurement Science

Background:

Conventional interferometry faces limitations in measuring rough surfaces due to phase ambiguity.
Absolute range determination is crucial for accurate 3D surface profiling.

Purpose of the Study:

To report a simple synthetic-wavelength interferometer for absolute range measurement.
To enable surface profiling of rough surfaces beyond conventional interferometry limits.

Main Methods:

Utilized a multimode laser diode emitting at two distinct wavelengths.
Employed interferometric phase measurements at both wavelengths.
Calculated absolute range using the difference in phase measurements.

Main Results:

Achieved absolute range information with an accuracy of 0.75 micrometers.
Established an ambiguity interval of 310 micrometers for the measurements.
Demonstrated the capability to profile surfaces too rough for conventional interferometry.

Conclusions:

The synthetic-wavelength interferometer offers a simple and effective method for absolute range measurement.
This technique expands the applicability of interferometry to rougher surfaces.
The instrument provides high-accuracy topographic information over a significant range.