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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.

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Scanning-probe Single-electron Capacitance Spectroscopy
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Published on: July 30, 2013

Charging processes in low vacuum scanning electron microscopy.

Bradley L Thiel1, Milos Toth, John P Craven

  • 1Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, UK. bt202@cus.cam.ac.uk

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 29, 2009
PubMed
Summary
This summary is machine-generated.

This study presents a framework for understanding charging in low vacuum scanning electron microscopy. It details how electric fields influence electron emission, charge trapping, and recombination, impacting imaging and spectra.

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Area of Science:

  • Materials Science
  • Physics
  • Electron Microscopy

Background:

  • Charging artifacts are a significant challenge in low vacuum scanning electron microscopy (LVSEM).
  • Understanding charging mechanisms is crucial for accurate imaging and analysis in LVSEM.
  • Existing models often lack a comprehensive approach to the interplay of electric fields and charging phenomena.

Purpose of the Study:

  • To develop a unified framework for understanding charging processes in LVSEM.
  • To elucidate the roles of electric fields above and below the specimen surface.
  • To correlate charging mechanisms with observable effects in LVSEM.

Main Methods:

  • Theoretical modeling of electric field distributions.
  • Analysis of charge dynamics including space charge formation, emission, trapping, and dissipation.
  • Examination of electron-ion recombination processes.
  • Correlation of theoretical models with experimental observations.

Main Results:

  • The framework identifies key charging processes: ionic space charge formation, field-enhanced electron emission, charge trapping/dissipation, and electron-ion recombination.
  • Electric fields above and below the specimen significantly influence these charging dynamics.
  • Specific microscope operating conditions enhance different charging processes.
  • Observable effects on gas gain curves, secondary electron images, and X-ray spectra are linked to these charging mechanisms.

Conclusions:

  • The presented framework provides a comprehensive understanding of charging in LVSEM.
  • The interplay of electric fields and charging phenomena is critical for LVSEM operation.
  • This understanding enables better control and mitigation of charging artifacts for improved data quality.