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Related Concept Videos

Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...

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Related Experiment Video

Updated: Jun 19, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
09:10

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements

Published on: December 5, 2025

Optical multimode frequency-domain reflectometer.

N Tan-No, T Ichimura, T Funaba

    Optics Letters
    |October 22, 2009
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel system using a multimode laser diode and fast Fourier transformation for ultrahigh resolution measurements. This method avoids frequency scanning, offering a significant advancement in optical sensing technology.

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    Last Updated: Jun 19, 2026

    The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
    09:10

    The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements

    Published on: December 5, 2025

    A Multimodal Wide-Field Fourier-Transform Raman Microscope
    06:48

    A Multimodal Wide-Field Fourier-Transform Raman Microscope

    Published on: December 30, 2025

    Area of Science:

    • Optics and Photonics
    • Spectroscopy
    • Laser Technology

    Background:

    • Traditional frequency-domain reflectometry methods require complex frequency scanning.
    • Achieving ultrahigh resolution in optical measurements is crucial for various scientific and industrial applications.

    Purpose of the Study:

    • To propose a novel system for ultrahigh resolution optical measurements.
    • To demonstrate a method that bypasses the need for frequency scanning.

    Main Methods:

    • Utilizing a free-running multimode laser diode.
    • Employing an optical spectrometer for spectral analysis.
    • Implementing a computing system for fast Fourier transformation (FFT).

    Main Results:

    • The proposed system can instantaneously generate a wide-band carrier frequency.
    • Achieved ultrahigh resolution of approximately 10 micrometers.
    • Eliminated the need for frequency scanning, unlike conventional methods.

    Conclusions:

    • The developed system offers a simpler and potentially faster approach to ultrahigh resolution measurements.
    • This technology has the potential to advance fields requiring precise optical sensing.