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Copper plating on the polyimide film by electroless plating techniques for EMI shielding
Eun Sun Ji1, Hyun Gil Cha, Chang Woo Kim
1Department of Chemistry, Sogang University, Seoul 121-742, Korea.
Journal of Nanoscience and Nanotechnology
|November 14, 2009
Summary
This study developed metal-plated polyimide films for electromagnetic interference (EMI) shielding using electroless plating. The resulting films demonstrated effective EMI shielding capabilities, showcasing potential for advanced electronic applications.
Area of Science:
- Materials Science
- Surface Engineering
- Electromagnetic Compatibility
Background:
- Electromagnetic interference (EMI) poses a significant challenge in electronic devices.
- Effective EMI shielding materials are crucial for device performance and reliability.
- Polyimide films offer a versatile substrate for developing advanced shielding solutions.
Purpose of the Study:
- To prepare metal-plated polyimide films for EMI shielding applications.
- To investigate the effect of nickel content in electroless copper plating on film properties.
- To evaluate the EMI shielding performance of the fabricated films.
Main Methods:
- Electroless plating technique used for metal film deposition on polyimide.
- Surface modification of polyimide via etching and silver activation.
- Characterization of copper layer thickness and surface morphology using Scanning Electron Microscopy (SEM).
- Calculation of EMI shielding effectiveness based on electromagnetic wave reflectivity and Schelkunoff theory.
Main Results:
- Successfully fabricated copper-plated polyimide films with varying nickel concentrations.
- SEM analysis revealed the surface morphology and thickness of the deposited copper layer.
- The study established a method to quantify EMI shielding ability through reflectivity measurements.
- The prepared films showed potential for effective EMI shielding.
Conclusions:
- Electroless plating is a viable method for creating EMI shielding films on polyimide.
- Nickel content in the plating solution influences the properties of the copper layer.
- The developed films exhibit promising electromagnetic interference shielding characteristics.

