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Updated: Jun 18, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
'All-inclusive' imaging of the rutile TiO(2)(110) surface using NC-AFM
Ralf Bechstein1, César González, Jens Schütte
1Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, D-49076 Osnabrück, Germany. ralf@inano.dk
Abstract:
Non-contact atomic force microscopy (NC-AFM) at true atomic resolution is used to investigate the (110) surface of rutile TiO(2). We are able to simultaneously resolve both bridging oxygen and titanium atoms of this prototypical oxide surface. Furthermore, the characteristic defect species, i.e. bridging oxygen vacancies, single and double hydroxyls as well as subsurface defects, are identified in the very same frame. We employ density functional theory (DFT) calculations to obtain a comprehensive understanding of the relation between the tip apex structure and the observed image contrast. Our results provide insight into the physical mechanisms behind atomic-scale contrast, indicating that electrostatic interaction can lead to a far more complex contrast than commonly assumed.
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