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Related Concept Videos

Cryo-electron Microscopy01:28

Cryo-electron Microscopy

Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...

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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
10:54

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

Published on: July 26, 2014

Cryomesh: a new substrate for cryo-electron microscopy.

Craig Yoshioka1, Bridget Carragher, Clinton S Potter

  • 1The National Resource for Automated Molecular Microscopy, The Scripps Research Institute, La Jolla, CA 92037, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|January 20, 2010
PubMed
Summary
This summary is machine-generated.

New silicon carbide grids reduce beam-induced movement (BIM) in cryo-transmission electron microscopy (cryo-TEM). This advancement improves imaging of tilted, cryo-preserved samples, enhancing data quality for 3D reconstructions.

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Last Updated: Jun 17, 2026

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
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Fabrication of Monolayer Graphene-Coated Grids for Cryoelectron Microscopy
06:53

Fabrication of Monolayer Graphene-Coated Grids for Cryoelectron Microscopy

Published on: September 8, 2023

Area of Science:

  • Cryo-electron microscopy
  • Materials science
  • Biophysics

Background:

  • Beam-induced movement (BIM) in transmission electron microscopy (TEM) degrades image quality, particularly for tilted, cryo-preserved biological specimens.
  • Low-temperature conductivity of grid substrates is a suspected factor influencing BIM severity.
  • Existing grid substrates present challenges for high-resolution cryo-TEM imaging at tilt.

Purpose of the Study:

  • To evaluate a novel doped silicon carbide grid substrate for cryo-transmission electron microscopy.
  • To assess the substrate's effectiveness in mitigating beam-induced movement (BIM).
  • To determine the impact of the new substrate on imaging tilted cryo-preserved samples.

Main Methods:

  • Fabrication of doped silicon carbide grids using semiconductor industry processes.
  • Evaluation of grid substrate performance in cryo-transmission electron microscopy.
  • Comparative analysis of BIM in tilted cryo-preserved samples on new versus conventional grids.

Main Results:

  • The new silicon carbide grid substrate significantly reduces the appearance and severity of beam-induced movement (BIM).
  • Improved imaging of tilted, cryo-preserved samples was observed using the novel grids.
  • Evidence suggests grid rigidity and flatness contribute to BIM reduction.

Conclusions:

  • The novel doped silicon carbide grid substrate enhances the reliability of cryo-TEM imaging at tilt.
  • This improvement supports advanced data collection methods like random conical tilt and orthogonal tilt reconstruction.
  • Reduced BIM has the potential to improve the resolution of three-dimensional cryo-reconstructions.