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Updated: Jun 17, 2026

Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Craig Yoshioka1, Bridget Carragher, Clinton S Potter
1The National Resource for Automated Molecular Microscopy, The Scripps Research Institute, La Jolla, CA 92037, USA.
New silicon carbide grids reduce beam-induced movement (BIM) in cryo-transmission electron microscopy (cryo-TEM). This advancement improves imaging of tilted, cryo-preserved samples, enhancing data quality for 3D reconstructions.
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