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Updated: Jun 16, 2026

Quantifying Intermembrane Distances with Serial Image Dilations
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Automatic photoelastimeter for determining very small dilatations.

W Primak, R Kampwirth

    Applied Optics
    |January 23, 2010
    PubMed
    Summary
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    This study introduces a highly sensitive method for measuring minute changes in birefringence, enabling the detection of subtle radiation-induced dilatations in materials like vitreous silica.

    Area of Science:

    • Materials Science
    • Optical Physics
    • Instrumentation

    Background:

    • Birefringence measurement is crucial for characterizing material properties.
    • Detecting subtle changes in materials, such as radiation-induced dilatation, requires high sensitivity.
    • Existing methods may lack the precision needed for observing extremely small deformations.

    Purpose of the Study:

    • To develop a highly sensitive optical system for birefringence measurement.
    • To achieve a sensitivity of 0.03-mmicro birefringence.
    • To detect and quantify radiation-induced dilatation in materials.

    Main Methods:

    • Utilized a modulated plastic disk (~6-mmicro birefringence) rotated at 30 Hz to create a 60 Hz signal.
    • Employed a notch filter to reject the 120 Hz component and a narrow-band active filter for the 60 Hz signal.

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    Last Updated: Jun 16, 2026

    Quantifying Intermembrane Distances with Serial Image Dilations
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  • Integrated a servo motor for automated compensator adjustment and an x-y recorder for data plotting.

    • Main Results:

    • Achieved a sensitivity of 0.03-mmicro birefringence.
    • Successfully detected radiation-induced dilatation as small as 3 x 10(-8) in vitreous silica.
    • Demonstrated the capability to detect 1% dilatation in a surface layer as thin as 30 Angstroms.

    Conclusions:

    • The developed system offers unprecedented sensitivity for birefringence measurements.
    • This technique is effective for observing subtle radiation-induced effects in materials.
    • The automated system allows for precise and efficient characterization of material deformation.