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Published on: January 17, 2018
Atom probe tomography analysis of poly(3-alkylthiophene)s
T J Prosa1, S Kostrna Keeney, T F Kelly
1Imago Scientific Instruments Corporation, Madison, WI 53711, USA. tprosa@imago.com
Journal of Microscopy
|January 26, 2010
Summary
Pulsed-laser atom-probe tomography revealed distinct poly(3-alkylthiophene) film morphologies. Solution-cast films showed uniform structures, while electrospray films exhibited non-uniformity, with critical laser energy impacting morphology.
Area of Science:
- Materials Science
- Analytical Chemistry
- Polymer Science
Background:
- Poly(3-alkylthiophene)s are crucial organic semiconductors.
- Controlling film morphology is vital for device performance.
- Pulsed-laser atom-probe tomography (PLAPT) offers nanoscale chemical and structural insights.
Purpose of the Study:
- To compare the field-evaporation mass spectrum and spatial distribution of molecular fragments from poly(3-alkylthiophene) films.
- To investigate the influence of two deposition methods (solution-cast vs. electrospray) on film characteristics.
- To explore the effect of laser-pulse energy on electrospray-deposited films.
Main Methods:
- Pulsed-laser atom-probe tomography (PLAPT) was employed.
- Analysis of field-evaporation mass spectra and fragment distribution.
- Comparison of films deposited via modified solution-cast and electrospray ionization methods.
Main Results:
- Solution-cast films yielded small fragments with uniform morphology.
- Electrospray films produced a wide range of fragments with non-uniform morphology.
- Common fragments included C(2)H(5)(+), CH(3)(+), C(2)H(4)(+); a critical laser pulse energy indicated changes in electrospray film morphology with a new 190 Da fragment.
Conclusions:
- Deposition method significantly impacts poly(3-alkylthiophene) film morphology and fragmentation patterns.
- PLAPT is effective in characterizing nanoscale structural differences.
- Laser-pulse energy is a critical parameter influencing electrospray deposition analysis.
