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Atom Probe Tomography Analysis of Exsolved Mineral Phases
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Encapsulation method for atom probe tomography analysis of nanoparticles.

D J Larson1, A D Giddings1, Y Wu2

  • 1CAMECA Instruments Inc., 5500 Nobel Drive, Madison, WI 53711, USA.

Ultramicroscopy
|March 10, 2015
PubMed
Summary
This summary is machine-generated.

Encapsulating open-space nanomaterials in a matrix enables atom probe tomography (APT) analysis. This study demonstrates successful encapsulation of platinum nanoparticles in ZnO:Al, overcoming prior analytical limitations for these important materials.

Keywords:
Atom probe tomographyField evaporationNanoparticlesSimulation

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Analytical Chemistry

Background:

  • Open-space nanomaterials are crucial but difficult to analyze with atom probe tomography (APT).
  • Challenges include specimen preparation, field evaporation, and data reconstruction for non-compact materials.
  • Encapsulation in a matrix is explored as a potential solution.

Purpose of the Study:

  • To investigate the feasibility of encapsulating open-space nanomaterials for APT analysis.
  • To demonstrate a method for preparing such materials for APT.
  • To evaluate the accuracy of APT reconstructions for encapsulated nanoparticles.

Main Methods:

  • Simulations of field evaporation to understand void artifacts.
  • Encapsulation of platinum (Pt) nanoparticles using atomic layer deposition (ALD) of a ZnO:Al matrix.
  • Correlation of APT measurements with transmission electron microscopy (TEM) and numerical simulations.

Main Results:

  • Simulations confirmed the necessity of void-free encapsulation for accurate APT.
  • ALD provided conformal coating of Pt nanoparticles with ZnO:Al.
  • Successful APT analysis of encapsulated Pt nanoparticles was achieved.

Conclusions:

  • Encapsulation in a conformal matrix is a viable strategy for APT analysis of open-space nanomaterials.
  • This approach overcomes previous limitations in specimen preparation and data reconstruction.
  • The demonstrated method enables detailed nanoscale characterization of technologically important materials.