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Related Experiment Video

Updated: Jun 16, 2026

Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities

Published on: November 30, 2012

Scaling rules for thin-film optical waveguides.

H Kogelnik, V Ramaswamy

    Applied Optics
    |February 6, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A new asymmetry measure characterizes asymmetric thin-film optical waveguides. This enables universal charts for determining waveguide properties like cutoff and effective thickness using simple scaling rules.

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    Area of Science:

    • Optics and Photonics
    • Materials Science

    Background:

    • Thin-film optical waveguides are crucial components in integrated optics.
    • Characterizing asymmetric waveguides (those with differing refractive indices) presents unique challenges.

    Purpose of the Study:

    • To introduce a novel asymmetry measure for characterizing asymmetric thin-film optical waveguides.
    • To develop universal charts for determining key waveguide parameters.

    Main Methods:

    • Introduction of a new asymmetry measure for refractive index.
    • Integration of this measure with normalized frequency for universal chart plotting.
    • Application of simple scaling rules to extract waveguide properties.

    Main Results:

    • Universal charts are generated, enabling determination of guide cutoff, effective guide index, and effective guide thickness.

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  • The minimum effective guide thickness is identified as a direct function of wavelength and film/substrate indices.

    • Conclusions:

    • The developed asymmetry measure provides a powerful tool for analyzing asymmetric thin-film optical waveguides.
    • Universal charts simplify the design and analysis of optical waveguides, reducing complexity.