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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Randomly spaced phased arrays with large interelement spacing

V J Corcoran

    Applied Optics
    |February 20, 2010
    PubMed
    Summary

    No abstract available in PubMed .

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