Measuring Reaction Rates
IR Spectrometers
Attenuated Total Reflectance (ATR) Infrared Spectroscopy: Overview
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 15, 2026

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
Shunji Kitamoto1, Hiroshi Murakami, Youich Shishido
1Department of Physics, Rikkyo University, 3-34-1 Nishi-Ikebukuro, Toshima-ku, Tokyo 171-8501, Japan. kitamoto@rikkyo.ac.jp
Researchers developed a new X-ray polarimeter using a multilayer optic and a CCD detector. This device effectively measures X-ray polarization with high transmission, enabling advanced imaging and spectroscopy.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: