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Intermittent contact scanning nonlinear dielectric microscopy.

Yoshiomi Hiranaga¹, Yasuo Cho

¹Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.

The Review of Scientific Instruments

|March 3, 2010

Summary

Intermittent contact scanning nonlinear dielectric microscopy (IC-SNDM) offers improved nanoscale surface topography and ferroelectric domain imaging. This novel technique reduces tip and sample damage for enhanced measurement reproducibility compared to contact mode methods.

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Area of Science:

Materials Science
Surface Physics
Nanotechnology

Background:

Scanning Nonlinear Dielectric Microscopy (SNDM) is a technique for observing domain structures.
Conventional SNDM operates in contact mode, which can lead to tip and sample damage.
This damage can reduce the reproducibility of measurements.

Purpose of the Study:

To develop a novel technique for surface topography measurements and domain structure observation.
To improve the reproducibility of SNDM measurements.
To investigate the performance of intermittent contact mode in SNDM.

Main Methods:

Development of Intermittent Contact Scanning Nonlinear Dielectric Microscopy (IC-SNDM).
Observation of domain structures on ferroelectric single crystals using IC-SNDM.
Experimental determination of the minimum probe loading force for IC-SNDM.

Main Results:

Nanoscale resolution imaging of domain structures on ferroelectric single crystals was achieved using IC-SNDM.
IC-SNDM demonstrated improved measurement reproducibility compared to conventional contact mode SNDM.
Reduced tip and/or sample damage was observed in intermittent contact mode.

Conclusions:

IC-SNDM is a viable novel technique for high-resolution surface topography and domain structure analysis.
The intermittent contact mode significantly enhances measurement reproducibility by minimizing damage.
Understanding the minimum loading force is crucial for optimizing IC-SNDM performance.