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Silicon vidicon system for measuring laser intensity profiles.

W L Smith, A J Degroot, M J Weber

    Applied Optics
    |March 9, 2010
    PubMed
    Summary

    This study introduces a rapid silicon-target vidicon system for analyzing laser beam profiles. The system offers high sensitivity uniformity and dynamic range, outperforming traditional film methods for laser analysis.

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    Area of Science:

    • Optics and Photonics
    • Laser Technology
    • Materials Science

    Background:

    • Accurate characterization of laser beam intensity profiles is crucial for various scientific and industrial applications.
    • Traditional methods like photographic film can be slow and have limitations in dynamic range and uniformity.
    • Developing rapid, high-fidelity diagnostic tools for laser systems is an ongoing need.

    Purpose of the Study:

    • To describe a novel silicon-target vidicon and minicomputer system for real-time laser beam intensity profile analysis.
    • To evaluate the system's performance, including sensitivity, dynamic range, and accuracy, for neodymium laser pulses.
    • To compare the vidicon system's capabilities against conventional photographic techniques.

    Main Methods:

    • A silicon-target vidicon coupled with a minicomputer was employed for data acquisition and processing.
    • Modifications were made to commercial cameras for linearized output and timing control.
    • Laser beam profiles were recorded using a video disk recorder, digitized, and stored on magnetic disks for analysis.
    • Neutron-transmutation-doped silicon targets were utilized to minimize spatial nonuniformities and interference.

    Main Results:

    • The system demonstrated high sensitivity uniformity (93% peak-to-peak over 9.6 mm) and a linear dynamic range exceeding 20.
    • Absolute flux agreement within +/-10% was achieved, with peak energy flux analysis completed within 100 seconds post-laser pulse.
    • The vidicon system showed superior performance compared to photographic film techniques in terms of speed and uniformity.

    Conclusions:

    • The developed silicon-target vidicon system provides rapid, accurate, and reliable measurement of laser beam intensity profiles.
    • The system's enhanced uniformity and dynamic range make it a valuable alternative to photographic methods.
    • This technology is adaptable for various laser wavelengths, pulse durations, and non-laser applications requiring intensity profile analysis.

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