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Rapid scan phase modulator for interferometric applications.

D J Campbell, P A Krug, I S Falconer

|March 24, 2010

Summary

This summary is machine-generated.

A novel rapid scan phase modulator offers high-speed optical path length changes with minimal attenuation. This innovative device is suitable for various interferometric applications across different spectral regions.

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Area of Science:

Optics and Photonics
Interferometry
Wave Physics

Background:

Interferometric techniques are crucial for precise measurements.
High-speed phase modulation is essential for advanced optical systems.
Existing modulators may have limitations in speed, attenuation, or environmental stability.

Purpose of the Study:

To investigate a new rapid scan phase modulator.
To evaluate its performance in interferometric applications.
To determine its suitability for visible to millimeter wave regions.

Main Methods:

The study involved a phase modulator with two parallel mirrors on a rotating platform.
Performance was assessed across a range of interferometric applications.
Testing covered spectral regions from visible to millimeter waves.

Main Results:

The modulator demonstrated capability for large optical path length changes at high speeds.
It exhibited low attenuation.
The system showed relative insensitivity to vibration.
A nearly flat transmission envelope was achieved.

Conclusions:

The rapid scan phase modulator is effective for interferometric applications.
Its high speed, low attenuation, and stability make it a versatile tool.
The device shows promise for use across a broad spectral range.