Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Eccentricity of an Ellipse

Eccentricity of an Ellipse

An ellipse is a fundamental conic section defined by the constant sum of distances from any point on its curve to two fixed points, known as the foci. This geometric property can be physically demonstrated using a pencil, string, and two pins. By anchoring the string at both ends and maintaining it taut with a pencil, one can trace the outline of an ellipse.The shape and extent of the ellipse are determined by its eccentricity, e, defined as the ratio of the distance between the center and a...

Contaminants and Errors

Contaminants and Errors

Effective sample preparation is crucial for accurate and reliable laboratory analysis. During this process, two significant sources of error can arise: concentration bias from improper sample splitting and contamination caused by methods used to reduce particle size, such as grinding or homogenization. Identifying and minimizing these potential errors is crucial to ensuring the validity of the analysis.
Another key consideration is determining the appropriate number of samples required to...

Uncertainty in Measurement: Accuracy and Precision

Uncertainty in Measurement: Accuracy and Precision

Scientists typically make repeated measurements of a quantity to ensure the quality of their findings and to evaluate both the precision and the accuracy of their results. Measurements are said to be precise if they yield very similar results when repeated in the same manner. A measurement is considered accurate if it yields a result that is very close to the true or the accepted value. Precise values agree with each other; accurate values agree with a true value.

Accuracy and Precision

Accuracy and Precision

Scientists typically make repeated measurements of a quantity to ensure the quality of their findings and to evaluate both the precision and the accuracy of their results. Measurements are said to be precise if they yield very similar results when repeated in the same manner. A measurement is considered accurate if it yields a result that is very close to the true or the accepted value. Precise values agree with each other; accurate values agree with a true value. Highly accurate measurements...

Calibration Curves: Correlation Coefficient

Calibration Curves: Correlation Coefficient

In a linear calibration curve, there is a value called the calibration coefficient, denoted by 'r,' which measures the strength and the direction of association between two variables. The correlation coefficient value ranges from −1 to +1. A value of +1 indicates a perfect positive linear correlation, −1 denotes a perfect negative correlation, and 0 implies no correlation between the two variables. A positive correlation value establishes that as one variable increases, the other increases, and...

NMR Spectrometers: Resolution and Error Correction

NMR Spectrometers: Resolution and Error Correction

When magnetic nuclei in a sample achieve resonance and undergo relaxation, the signal detected in NMR is an approximately exponential free induction decay. Fourier transform of an exponential decay yields a Lorentzian peak in the frequency domain. Lorentzian peaks in an NMR spectrum are defined by their amplitude, full width at half maximum, and position, where the peak width is governed by the spin-spin relaxation time alone. In real experiments, however, the applied magnetic field is rendered...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Optimizing null ellipsometry for oxidized silicon.

Applied optics·2010

Same author

Optical properties of Zircaloy and Zircaloy oxide by ellipsometry.

Applied optics·2010

Same author

In process ellipsometer azimuth angle calibration.

Applied optics·2010

Same author

Ellipsometer nulling: convergence and speed.

Applied optics·2010

Same author

Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.

Applied optics·2010

Same author

Sensitivity of the Ellipsometric Parameters to Angle-of-Incidence Variations.

Applied optics·2010

Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026

Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026

Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026

Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026

Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026

Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026

See all related articles

Search research articles

Related Experiment Video

Updated: Jun 14, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Parameter correlation and precision in multiple-angle ellipsometry.

G H Bu-Abbud, N M Bashara

|March 25, 2010

Summary

This summary is machine-generated.

A new method using multiple-angle-of-incidence ellipsometry precisely characterizes optical parameters of surfaces. This technique improves precision by minimizing parameter correlation, enabling accurate determination of material properties like refractive index and thickness.

More Related Videos

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Published on: September 8, 2023

Related Experiment Videos

Last Updated: Jun 14, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization

Published on: September 8, 2023

Area of Science:

Materials Science
Optical Physics
Surface Science

Background:

Accurate characterization of optical parameters is crucial for material analysis.
Ellipsometry is a powerful technique for thin film analysis, but precision can be limited by parameter correlations.

Purpose of the Study:

Develop a general procedure for optical parameter characterization using multiple-angle-of-incidence ellipsometry.
Quantitatively evaluate the precision of estimated parameters and identify factors influencing it.

Main Methods:

Developed a fixed wavelength multiple-angle-of-incidence ellipsometry procedure.
Analyzed parameter precision using least squares fit error, parameter cross-correlation, and variance-covariance relations.
Utilized a silicon dioxide-silicon substrate system for experimental validation.

Main Results:

Demonstrated that lower parameter correlation improves precision when using a correct system model.
Achieved high precision in determining the complex refractive index of silicon and the extinction coefficient of silicon dioxide.
Estimated oxide refractive index and thickness with reasonable confidence, despite observed cross-correlation.

Conclusions:

The developed multiple-angle-of-incidence ellipsometry procedure offers a robust method for optical parameter characterization.
Minimizing parameter correlation is key to enhancing measurement precision.
The method successfully determined optical properties of the silicon dioxide-silicon system, highlighting its practical applicability.