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Updated: Jun 14, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Sacrificial tamper slows down sample explosion in FLASH diffraction experiments.

Stefan P Hau-Riege¹, Sébastien Boutet, Anton Barty

¹Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550, USA. hauriege1@llnl.gov

Physical Review Letters

|April 7, 2010

Summary

This summary is machine-generated.

Free-electron lasers enable near-atomic resolution imaging. A new technique using a tamper layer extends sample lifetime, making <1 nm resolution imaging feasible.

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$Synthesis and Microdiffraction at Extreme Pressures and Temperatures$

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Published on: October 7, 2013

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$Synthesis and Microdiffraction at Extreme Pressures and Temperatures$

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Published on: October 7, 2013

Area of Science:

X-ray science
Materials science
Nanotechnology

Background:

Intense, ultrashort X-ray pulses from free-electron lasers (FELs) offer potential for near-atomic resolution imaging.
Crystallization is typically required for high-resolution imaging, limiting sample types.
High photon fluences and pulse durations shorter than sample destruction times are critical for FEL imaging.

Purpose of the Study:

To demonstrate a femtosecond pump-probe diffraction technique for high-resolution imaging.
To investigate methods for extending sample lifetime under intense X-ray irradiation.
To assess the feasibility of achieving <1 nm resolution imaging with FELs.

Main Methods:

Utilized coherent 0.1 keV X-rays from the FLASH soft X-ray free-electron laser.
Employed a femtosecond pump-probe diffraction setup.
Incorporated a tamper layer to mitigate sample explosion.

Main Results:

Successfully extended the lifetime of a nanostructured sample to several picoseconds.
Demonstrated the effectiveness of the tamper layer in dampening and quenching sample explosion.
Achieved conditions suitable for <1 nm resolution imaging.

Conclusions:

The developed femtosecond pump-probe diffraction technique is effective for high-resolution imaging.
Tamper layers significantly enhance sample survivability under intense X-ray pulses.
Near-atomic resolution imaging of non-crystalline samples is feasible with FELs.