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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Three-Dimensional Microscopy in Microbiology01:28

Three-Dimensional Microscopy in Microbiology

Three-dimensional imaging techniques are essential in cell biology, allowing researchers to visualize intricate cellular structures with high resolution. Two prominent methods, Differential Interference Contrast Microscopy (DIC) and Confocal Scanning Laser Microscopy (CSLM), provide distinct advantages for imaging live and thick specimens, respectively.Differential Interference Contrast MicroscopyDIC microscopy enhances contrast in transparent, unstained samples by converting phase...
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: Jun 14, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Three-dimensional atomic force microscopy - taking surface imaging to the next level.

Mehmet Z Baykara1, Todd C Schwendemann, Eric I Altman

  • 1Department of Mechanical Engineering, Center for Research on Interface Structures and Phenomena, Yale University, New Haven, CT 06520-8284, USA.

Advanced Materials (Deerfield Beach, Fla.)
|April 10, 2010
PubMed
Summary
This summary is machine-generated.

Three-dimensional atomic force microscopy (3D-AFM) maps surface force and energy fields at atomic resolution. This advanced technique provides unprecedented detail for understanding material properties and enables new applications in chemistry and materials science.

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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Related Experiment Videos

Last Updated: Jun 14, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
05:04

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Area of Science:

  • Surface science
  • Atomic force microscopy
  • Materials characterization

Background:

  • Material properties depend on atomic interactions.
  • Surface phenomena are governed by site-specific force and energy fields.
  • Detailed mapping of these fields is crucial for understanding materials.

Purpose of the Study:

  • Review recent advancements in three-dimensional atomic force microscopy (3D-AFM).
  • Explain the principles and data acquisition of 3D-AFM.
  • Highlight potential applications of this technique.

Main Methods:

  • Utilizes noncontact atomic force microscopy principles.
  • Employs simultaneous multi-channel data acquisition.
  • Collects complementary spatial data including energy dissipation and tunneling currents.

Main Results:

  • Demonstrates dense, three-dimensional mapping of surface fields with atomic resolution.
  • Provides more detailed surface property information than previous methods.
  • Illustrates data acquisition and extraction using graphite and pentacene.

Conclusions:

  • 3D-AFM offers significant advancements in surface characterization.
  • The technique enables detailed analysis of atomic interactions and surface fields.
  • Potential applications span chemical imaging, catalysis, and nanotribology.