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Updated: Jun 14, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Mehmet Z Baykara1, Todd C Schwendemann, Eric I Altman
1Department of Mechanical Engineering, Center for Research on Interface Structures and Phenomena, Yale University, New Haven, CT 06520-8284, USA.
Three-dimensional atomic force microscopy (3D-AFM) maps surface force and energy fields at atomic resolution. This advanced technique provides unprecedented detail for understanding material properties and enables new applications in chemistry and materials science.
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