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08:01
Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
Published on: November 21, 2019
Kinoform optics applied to X-ray photon correlation spectroscopy
A R Sandy1, S Narayanan, M Sprung
1X-ray Science Division, Argonne National Laboratory, Argonne, IL 60439, USA. asandy@anl.gov
Journal of Synchrotron Radiation
|April 20, 2010
Summary
Silicon kinoform lenses enhance small-angle X-ray photon correlation spectroscopy (XPCS) experiments. These lenses increase usable coherent X-ray flux from light sources, improving XPCS measurements.
Area of Science:
- Optics
- Materials Science
- Spectroscopy
Background:
- Small-angle X-ray photon correlation spectroscopy (XPCS) requires high coherent X-ray flux.
- Third-generation storage-ring light sources provide advanced X-ray capabilities.
- Focusing optics are crucial for optimizing X-ray beam properties.
Purpose of the Study:
- To fabricate and characterize moderate-demagnification higher-order silicon kinoform lenses.
- To evaluate the focusing performance of these lenses.
- To assess their applicability for small-angle XPCS experiments.
Main Methods:
- Fabrication of silicon kinoform lenses with specific geometric properties.
- Measurement of lens focusing performance.
- Integration and testing of lenses in XPCS experimental setups.
Main Results:
- Successfully fabricated moderate-demagnification higher-order silicon kinoform lenses.
- Demonstrated effective focusing capabilities of the kinoform lenses.
- Quantified the increase in usable coherent flux for XPCS.
Conclusions:
- Silicon kinoform lenses are suitable for enhancing small-angle XPCS experiments.
- One-dimensional vertical X-ray focusing significantly boosts coherent flux.
- These lenses improve the efficiency of XPCS measurements at synchrotron light sources.
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