Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Absorption Spectroscopy: Atomization Methods

Atomic Absorption Spectroscopy: Atomization Methods

Atomic Absorption Spectroscopy (AAS) atomizes samples through flame atomization or electrothermal atomization. Flame atomization typically involves a nebulizer and spray chamber assembly to combine the sample with a fuel–oxidant mixture, creating a fine aerosol mist that enters a burner. Typically, the fuel and oxidant are combined in an approximately stoichiometric ratio. However, for atoms that are easily oxidized, a fuel-rich mixture may be more advantageous. Only about 5% of the aerosol...

Mass Spectrum: Interpretation

Mass Spectrum: Interpretation

An unknown compound can be established by identifying the molecular ion peak in the mass spectrum. The molecular ion peak is often weak or absent due to the predominance of fragmentation in high-energy electron beams. In such cases, a soft-energy electron beam can be used to scan the spectrum to enhance the intensity of the molecular ion peak. Additionally, chemical ionization, field ionization, and desorption ionization spectra are used to obtain a relatively intense molecular ion peak.To...

Chemical Ionization (CI) Mass Spectrometry

Chemical Ionization (CI) Mass Spectrometry

The molecular ion peak of a molecule in the mass spectrum provides vital information for molecular identification. However, conventional electron impact ionization can lead to the rapid dissociation of some molecular ions before they reach the detector. A milder ionization method is required to increase the lifetime of such ionized analyte molecules. Chemical ionization (CI) is a gas-phase protonation reaction useful for mass-analyzing analyte molecules that are easily protonated to yield the...

Atomic Emission Spectroscopy: Lab

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...

UV–Vis Spectroscopy: Molecular Electronic Transitions

UV–Vis Spectroscopy: Molecular Electronic Transitions

In Ultraviolet–Visible (UV–Vis) spectroscopy, the absorption of electromagnetic radiation is used to probe the electronic structure of molecules. This technique provides insights into molecular electronic transitions, particularly the movement of electrons between different molecular orbitals. Radiation is absorbed if the energy of the electromagnetic radiation passing through the molecule is precisely equal to the energy difference between the excited and ground states. During this process,...

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Time-of-flight mass spectrometry of particle emission during irradiation with slow, highly charged ions.

The Review of scientific instruments·2021

Same author

Direct, uncorrected, molecule-free analysis of

The Analyst·2018

Same author

A new setup for the investigation of swift heavy ion induced particle emission and surface modifications.

The Review of scientific instruments·2016

Same author

Investigating the Fundamentals of Molecular Depth Profiling Using Strong-field Photoionization of Sputtered Neutrals.

Surface and interface analysis : SIA·2015

Same author

Secondary ion mass spectrometry signatures for verifying declarations of fissile-material production.

Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine·2015

Same author

Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C<sub>60</sub>) cluster ions.

Surface and interface analysis : SIA·2013

Search research articles

Related Experiment Video

Updated: Jun 12, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

Published on: July 27, 2018

Strong-field Photoionization of Sputtered Neutral Molecules for Molecular Depth Profiling.

D Willingham¹, D A Brenes, A Wucher

¹Chemistry Department, Pennsylvania State University, 104 Chemistry Building, University Park, PA 16802, USA.

The Journal of Physical Chemistry. C, Nanomaterials and Interfaces

|May 25, 2010

Summary

This study uses C(60) cluster ions and photoionization to analyze guanine thin films. It reveals how ionization probability and interfacial damage affect molecular depth profiling accuracy.

More Related Videos

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation

Published on: October 30, 2012

Related Experiment Videos

Last Updated: Jun 12, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F⁻

Published on: July 27, 2018

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation

Molecular Beam Mass Spectrometry With Tunable Vacuum Ultraviolet (VUV) Synchrotron Radiation

Published on: October 30, 2012

Area of Science:

Materials Science
Surface Science
Analytical Chemistry

Background:

Understanding molecular behavior in thin films is crucial for materials development.
Depth profiling techniques are essential for characterizing material composition and structure.
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a common surface analysis method.

Purpose of the Study:

To investigate molecular depth profiles of guanine thin films on a silver substrate.
To compare secondary ion and photoionized neutral molecule signals for enhanced depth profiling.
To elucidate factors influencing depth profile properties, such as ionization probability and interfacial effects.

Main Methods:

Utilizing a 40 keV C(60) cluster ion beam for sputtering and analysis.
Employing Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for secondary ion detection.
Implementing strong-field, femtosecond photoionization to probe neutral guanine molecules.

Main Results:

Observed increased ionization probability for protonated molecular ions within the initial 10 nm.
Detected a 50% increase in fragment ion signal near the guanine/Ag interface due to chemical damage.
Identified an altered layer thickness of 20 nm resulting from ion beam-induced chemical mixing.

Conclusions:

Simultaneous analysis of secondary ions and photoionized neutrals provides fundamental insights into depth profiling.
The neutral component analysis aids in understanding ionization probability effects on molecular ion yield.
This combined approach offers more accurate depth-dependent chemical composition information than ToF-SIMS alone.