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Updated: Jun 12, 2026

ARL Spectral Fitting as an Application to Augment Spectral Data via Franck-Condon Lineshape Analysis and Color Analysis
Published on: August 19, 2021
[The spectral line profile with different electric microfield distribution functions].
Jun-Xia Ran1, Shao-Peng Zhang, Dong Ma
1College of Physics Science and Technology, Hebei University, Baoding 071002, China. rjxhbu@hbu.cn
Plasma ion impacts cause asymmetric Stark broadening spectral line profiles. Different electric microfield distribution functions affect the profile, with ion impact intensity being crucial for plasma diagnosis.
Area of Science:
- Plasma Physics
- Atomic Spectroscopy
Context:
- Stark broadening is a key phenomenon in plasma spectroscopy.
- Plasma ion impacts introduce asymmetry into spectral line profiles.
- Electric microfield distribution functions are critical for accurate line profile modeling.
Purpose:
- To investigate the influence of various electric microfield distribution functions on Stark broadening spectral line profiles.
- To analyze the impact of electron and ion broadening parameters on the sensitivity of line profiles to different distribution functions.
Summary:
- The study examines Stark broadening spectral line profiles under plasma ion impact, highlighting their inherent asymmetry.
- Comparisons with Holtsmark, nearest-neighbor field, and Mayer distributions reveal profile similarities and diversifications.
- Reduced electron and ion impact broadening parameters diminish the influence of different distribution functions.
Impact:
- The findings underscore the significant role of intense plasma ion impacts on spectral line profiles.
- Results offer valuable insights for plasma diagnosis and characterization using spectroscopic methods.
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