[The spectral line profile with different electric microfield distribution functions].

Jun-Xia Ran1, Shao-Peng Zhang, Dong Ma

  • 1College of Physics Science and Technology, Hebei University, Baoding 071002, China. rjxhbu@hbu.cn

Summary

Plasma ion impacts cause asymmetric Stark broadening spectral line profiles. Different electric microfield distribution functions affect the profile, with ion impact intensity being crucial for plasma diagnosis.

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