Measurement of the refractive-index profile in polycrystalline germanium-silicon alloy GRIN crystals

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Updated: Jun 12, 2026

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
06:57

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon

Published on: July 17, 2020

D P Naughton, J J Miceli, D T Moore

    Applied Optics
    |June 5, 2010
    PubMed

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    The Law of rational indices is a fundamental principle in the field of crystallography. According to this law, the intercepts of a crystal face along the crystallographic axes (the three-dimensional axes along which a crystal is measured) can be expressed as either equivalent to the unit intercepts (a, b, c) or simple whole number multiples of them. These multiples are typically denoted as na, n'b, and n''c, where n, n', and n'' are simple whole numbers.To illustrate, consider a crystal with...