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Updated: Jun 11, 2026

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
Published on: March 12, 2017
Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted
Sarah J Haigh1, Hidetaka Sawada, Kunio Takayanagi
1Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.
Abstract:
Tilted illumination exit-wave restoration is compared for two aberration-corrected instruments at different accelerating voltages. The experimental progress of this technique is also reviewed and the significance of off-axial aberrations examined. Finally, the importance of higher order aberration compensation combined with careful correction of the lower order aberrations is highlighted.
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