Ultrahigh-sensitivity single-photon detection with linear-mode silicon avalanche photodiode
Makoto Akiba1, Kenji Tsujino, Masahide Sasaki
1Quantum ICT Group, National Institute of Information and Communications Technology,4-2-1 Nukui-Kitamachi, Koganei, Tokyo 184-8795, Japan. akiba@nict.go.jp
Optics Letters
|August 4, 2010
Summary
We created a highly sensitive single-photon detector using a cooled avalanche photodiode (APD). This detector achieves ultra-low noise and a low dark-count rate, enabling precise photon detection.
Area of Science:
- Photonics
- Semiconductor Devices
- Cryogenic Engineering
Background:
- Single-photon detection is crucial for various scientific fields.
- Existing detectors often face limitations in sensitivity and noise.
Purpose of the Study:
- To develop an ultrahigh-sensitivity single-photon detector.
- To achieve a low noise-equivalent power and dark-count rate.
Main Methods:
- Utilized a linear-mode avalanche photodiode (APD) operated at cryogenic temperatures (78K).
- Employed a low-noise readout circuit.
- Implemented thermal treatment above 100K to reduce trapped carriers.
Main Results:
- Achieved a noise-equivalent power of 2.2x10(-20)W/Hz(1/2) at 450nm.
- Obtained a photon-detection efficiency of 0.72.
- Recorded a dark-count rate (DCR) as low as 0.0008 counts/s.
Conclusions:
- The developed detector demonstrates exceptional sensitivity and low noise.
- Cryogenic operation and thermal treatment are effective in minimizing dark counts.
- This technology advances capabilities for precise photon detection.
