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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

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Application of Monolayer Graphene to Cryo-Electron Microscopy Grids for High-resolution Structure Determination
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Corrugation in exfoliated graphene: an electron microscopy and diffraction study.

Andrea Locatelli1, Kevin R Knox, Dean Cvetko

  • 1Elettra, Sincrotrone Trieste SCpA, 34149 Basovizza, Trieste, Italy. andrea.locatelli@elettra.trieste.it

ACS Nano
|August 5, 2010
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Summary

Graphene corrugation, or roughness, decreases with thickness and substrate interaction. Suspended graphene is smoother than supported graphene, with single-layer films showing more roughness.

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Exfoliation and Analysis of Large-area, Air-Sensitive Two-Dimensional Materials

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Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Graphene's unique properties are influenced by its surface morphology.
  • Understanding corrugation is crucial for optimizing graphene-based devices.
  • Previous studies have explored graphene roughness at larger scales.

Purpose of the Study:

  • To quantitatively characterize corrugation in supported and suspended graphene at the nanoscale.
  • To investigate the influence of film thickness, substrate interaction, and environmental factors on graphene roughness.
  • To differentiate between intrinsic and extrinsic corrugation factors.

Main Methods:

  • Low-energy electron microscopy (LEEM) for high-resolution imaging.
  • Microprobe diffraction for analyzing surface structure and roughness.
  • Analysis of diffraction line shapes to quantify corrugation below 20 nm.

Main Results:

  • Corrugation decreases with increasing graphene film thickness due to enhanced stiffness.
  • Single-layer graphene exhibits significantly higher short-range roughness than multilayer graphene.
  • Suspended graphene is morphologically smoother than substrate-supported graphene due to the lack of substrate interactions.
  • Corrugation in suspended single-layer graphene is sensitive to adsorbate load and temperature.

Conclusions:

  • Graphene corrugation is a complex phenomenon influenced by film thickness, substrate interactions, and environmental conditions.
  • LEEM and microprobe diffraction provide powerful tools for nanoscale characterization of graphene surface morphology.
  • The findings offer insights into controlling and utilizing graphene's surface properties for various applications.