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Crosstalk quantification, analysis, and trends in CMOS image sensors
Lior Blockstein1, Orly Yadid-Pecht
1The VLSI Systems Center/Ben Gurion University, P.O. Box 653 Beer-Sheva, Israel. blockstein@gmail.com
Applied Optics
|August 25, 2010
Summary
Pixel crosstalk (CTK) is reduced by addressing pixel-architecture dependent CTK (PADC). This study defines PADC, analyzes its components, and presents technology trends in CMOS image sensors.
Area of Science:
- Image Sensor Technology
- Optoelectronics
- Semiconductor Devices
Background:
- Pixel crosstalk (CTK) is a significant issue in image sensors, affecting image quality.
- CTK comprises optical (OCTK), electrical (ECTK), and spectral (SCTK) components.
- Pixel-architecture dependent CTK (PADC) is the sum of OCTK and ECTK.
Purpose of the Study:
- To summarize methods for reducing pixel-architecture dependent CTK (PADC).
- To propose a quantifiable definition for PADC.
- To analyze PADC in different CMOS image sensor technologies and identify trends.
Main Methods:
- Review of various PADC reduction techniques.
- Empirical measurement of three CMOS image sensors using S-cube scanning technology.
- Analysis of PADC based on measurement data.
Main Results:
- A clear, quantifiable definition for PADC is proposed.
- PADC was measured and analyzed across different CMOS sensor technologies.
- Technology trends related to PADC were identified.
Conclusions:
- The study provides a framework for understanding and quantifying PADC.
- Empirical data reveals insights into PADC performance across various CMOS technologies.
- The findings contribute to the development of improved image sensor designs.
