Related Experiment Video
Updated: Jun 8, 2026

08:19
Patterning via Optical Saturable Transitions - Fabrication and Characterization
Published on: December 11, 2014
Physical optics modeling in soft-x-ray projection lithography
Applied Optics
|September 22, 2010
Abstract:
We develop a diffraction-based tool that can predict the image quality in projection lithography systems. The effects of partial coherence and source variations and imaging defects in both the condenser and the camera optics can all be determined.
