Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Correction of artefacts associated with large area EBSD.

Ultramicroscopy·2021
Same author

A one-generation reproductive toxicity study of the mycotoxin ochratoxin A in Fischer rats.

Food and chemical toxicology : an international journal published for the British Industrial Biological Research Association·2021
Same author

Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning.

Ultramicroscopy·2020
Same author

Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope.

Ultramicroscopy·2020
Same author

Indexing electron backscatter diffraction patterns with a refined template matching approach.

Ultramicroscopy·2019
Same author

Prenatal exposure to an environmentally relevant mixture of Canadian Arctic contaminants decreases male reproductive function in an aging rat model.

Journal of developmental origins of health and disease·2018
Same journal

Predictive drift compensation of multi-frame STEM via live scan modification.

Ultramicroscopy·2026
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
Same journal

Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

Ultramicroscopy·2026
Same journal

Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM).

Ultramicroscopy·2026
Same journal

Contamination analysis of the residual gas composition in transmission electron microscopy.

Ultramicroscopy·2026
See all related articles

Related Experiment Video

Updated: Jun 8, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.

T B Britton1, C Maurice, R Fortunier

  • 1Department of Materials, University of Oxford, Parks Road, Oxford, UK. benjamin.britton@materials.ox.ac.uk

Ultramicroscopy
|October 5, 2010
PubMed
Summary
This summary is machine-generated.

High-resolution electron backscatter diffraction (EBSD) precisely measures relative strain and rotation. However, accurate absolute measurements require careful calibration to overcome experimental uncertainties and simulation model choices.

More Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Related Experiment Videos

Last Updated: Jun 8, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • High-resolution electron backscatter diffraction (EBSD) is a powerful technique for analyzing material deformation.
  • Measuring absolute strain and rotation with EBSD requires reference patterns or known strain states.
  • Simulated EBSD patterns offer a promising approach for absolute strain determination.

Purpose of the Study:

  • To investigate the precision and limitations of using simulated EBSD patterns for absolute strain and rotation measurements.
  • To identify key sources of error in the EBSD-based strain analysis.

Main Methods:

  • Comparison of experimental EBSD patterns with simulated patterns generated using dynamical and kinematic models.
  • Analysis of the impact of experimental geometry (pattern center) and optical aberrations on strain measurements.
  • Evaluation of calibrant samples for experimental geometry determination.

Main Results:

  • Relative strain and rotation can be measured with high precision (∼ 10⁻⁴).
  • Uncertainties in pattern center (0.5%) and lens aberrations lead to strain uncertainties of ∼ 10⁻³.
  • The choice of simulation model (dynamical vs. kinematic) significantly affects shift measurements, especially at high-intensity bands.
  • Imprecise stage movement and SEM depth of field contribute to strain uncertainties of ∼ 10⁻³.

Conclusions:

  • Precise measurement of experimental geometry is crucial for accurate absolute strain determination using simulated EBSD.
  • Careful consideration of simulation models and potential optical aberrations is necessary to avoid erroneous strain measurements.
  • Further refinement of EBSD methodologies is needed to minimize uncertainties and enhance the reliability of absolute strain analysis.