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Updated: Jun 8, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Viswanath Bavigadda1, Raghavendra Jallapuram, Emilia Mihaylova
1Centre for Industrial and Engineering Optics, Dublin Institute of Technology, Kevin Street, Dublin 8, Ireland.
This study introduces a compact electronic speckle-pattern interferometer (ESPI) using holographic optical elements (HOEs). This innovative design simplifies vibration analysis by minimizing alignment issues and enhancing fringe pattern generation.
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