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Updated: Jun 7, 2026

Optimized Setup and Protocol for Magnetic Domain Imaging with In Situ Hysteresis Measurement
Published on: November 7, 2017
2D soft x-ray system on DIII-D for imaging the magnetic topology in the pedestal region
M W Shafer1, D J Battaglia, E A Unterberg
1Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA. shafer@fusion.gat.com
Abstract:
A new tangential two-dimensional soft x-ray imaging system (SXRIS) is being designed to examine the edge island structure in the lower X-point region of DIII-D. Plasma shielding and/or amplification of the calculated vacuum islands may play a role in the suppression of edge-localized modes via resonant magnetic perturbations (RMPs). The SXRIS is intended to improve the understanding of three-dimensional (3D) phenomena associated with RMPs. This system utilizes a tangential view with a pinhole imaging system and spectral filtering with beryllium foils. SXR emission is chosen to avoid line radiation and allows suitable signal at the top of a H-mode pedestal where T(e)∼1-2 keV. A synthetic diagnostic calculation based on 3D SXR emissivity estimates is used to help assess signal levels and resolution of the design. A signal-to-noise ratio of 10 at 1 cm resolution is expected for the perturbed signals, which are sufficient to resolve most of the predicted vacuum island sizes.
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