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Updated: Jun 6, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Reconfigurable intelligent optical backplane for parallel computing and communications

T H Szymanski, H S Hinton

    Applied Optics
    |November 19, 2010
    PubMed

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