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Related Concept Videos

Interference: Path Lengths01:10

Interference: Path Lengths

Consider two sources of sound, that may or may not be in phase, emitting waves at a single frequency, and consider the frequencies to be the same.
Two special sources may be considered when they are in phase. This can be easily achieved by feeding the two sources from the same source. An example would be synchronizing the two speakers by feeding them with the same source, such as the sound waves produced by a tuning fork. This setup ensures that the two sources have the same frequency and are...
Time and frequency -Domain Interpretation of Phase-lead Control01:24

Time and frequency -Domain Interpretation of Phase-lead Control

Phase-lead controllers are commonly used in various control systems to enhance response speed and stability. Adjusting the brightness on a television screen offers a practical example of phase-lead control. When contrast is enhanced, a phase-lead controller is employed. Mathematically, phase-lead control is identified when the first parameter is smaller than the second.
The design of phase-lead control involves the strategic placement of poles and zeros to balance steady-state error and system...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
IR Spectrum Peak Splitting: Symmetric vs Asymmetric Vibrations01:08

IR Spectrum Peak Splitting: Symmetric vs Asymmetric Vibrations

Identical bonds within a polyatomic group can stretch symmetrically (in-phase) or asymmetrically (out-of-phase). Similar to hydrogen bonding, these vibrations also influence the shape of the IR peak. Generally, asymmetric stretching frequencies are higher than symmetric stretching frequencies. For example, primary amines exhibit two distinct IR peaks between 3300–3500 cm−1 corresponding to the symmetric and asymmetric N-H stretching, while secondary amines exhibit a single stretching vibration...
Double Resonance Techniques: Overview01:12

Double Resonance Techniques: Overview

Double resonance techniques in Nuclear Magnetic Resonance (NMR) spectroscopy involve the simultaneous application of two different frequencies or radiofrequency pulses to manipulate and observe two distinct nuclear spins. One important application of double resonance is spin decoupling, which selectively suppresses coupling with one type of nucleus while observing the NMR signal from another nucleus, simplifying the spectrum and enhancing resolution.
Spin decoupling is usually achieved by...

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Related Experiment Video

Updated: Jun 6, 2026

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator
08:39

Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator

Published on: January 28, 2019

Phase determination from mostly one-sided interferograms.

D G Johnson, W A Traub, K W Jucks

    Applied Optics
    |November 19, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study presents a new method to correct nonlinear phase shifts and spectrometer emission backgrounds in interferograms. The technique uses auxiliary spectra for accurate spectral analysis of emission-line sources.

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    Last Updated: Jun 6, 2026

    Shaping the Amplitude and Phase of Laser Beams by Using a Phase-only Spatial Light Modulator
    08:39

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    Published on: January 28, 2019

    Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)
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    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
    10:39

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

    Published on: October 11, 2016

    Area of Science:

    • Spectroscopy
    • Optical Interferometry
    • Astrophysical Instrumentation

    Background:

    • Interferograms are crucial for spectral analysis but can suffer from nonlinear phase shifts.
    • Spectrometers can introduce unwanted out-of-phase emission backgrounds, complicating data interpretation.
    • Accurate spectral measurements are vital for characterizing emission-line sources in various scientific fields.

    Purpose of the Study:

    • To develop a method for detecting and correcting nonlinear phase shifts in one-sided interferograms.
    • To simultaneously correct for out-of-phase emission backgrounds from spectrometers.
    • To enable more accurate spectral analysis of emission-line sources.

    Main Methods:

    • Utilizing a primarily one-sided interferogram of an emission-line source.
    • Employing two auxiliary spectra: one from a strong continuum source and another from an emission-line source with minimal continuum.
    • Implementing a simultaneous detection and correction algorithm.

    Main Results:

    • Successfully demonstrated the detection and correction of nonlinear phase shifts.
    • Achieved simultaneous correction of spectrometer-induced out-of-phase emission backgrounds.
    • Validated the method's effectiveness for emission-line spectral analysis.

    Conclusions:

    • The proposed method provides a robust solution for correcting common artifacts in interferometric data.
    • This technique enhances the reliability of spectral analysis for emission-line sources.
    • The approach is applicable to various spectroscopic applications requiring high-fidelity measurements.