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Updated: Jun 6, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
15:04

Picometer-Precision Atomic Position Tracking through Electron Microscopy

Published on: July 3, 2021

Variable resolution fluctuation electron microscopy on Cu-Zr metallic glass using a wide range of coherent STEM probe

Jinwoo Hwang1, P M Voyles

  • 1Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706-1595, USA. jhwang3@wisc.edu

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|December 3, 2010
PubMed

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