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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
Atomic Absorption Spectroscopy: Atomization Methods01:25

Atomic Absorption Spectroscopy: Atomization Methods

Atomic Absorption Spectroscopy (AAS) atomizes samples through flame atomization or electrothermal atomization. Flame atomization typically involves a nebulizer and spray chamber assembly to combine the sample with a fuel–oxidant mixture, creating a fine aerosol mist that enters a burner. Typically, the fuel and oxidant are combined in an approximately stoichiometric ratio. However, for atoms that are easily oxidized, a fuel-rich mixture may be more advantageous. Only about 5% of the aerosol...
Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...

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Related Experiment Video

Updated: Jun 6, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities

Published on: July 24, 2015

Atom-by-atom spectroscopy at graphene edge.

Kazu Suenaga1, Masanori Koshino

  • 1Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST), AIST Central 5, Tsukuba 305-8565, Japan. suenaga-kazu@aist.go.jp

Nature
|December 17, 2010
PubMed
Summary
This summary is machine-generated.

Researchers developed a new method for single-atom spectroscopy to analyze atomic configurations in graphene nanodevices. This technique allows for detailed electronic and bonding structure analysis at the atomic level, crucial for future nanoscale electronics.

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Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
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Microscopic Visualization of Porous Nanographenes Synthesized through a Combination of Solution and On-Surface Chemistry

Published on: March 4, 2021

Area of Science:

  • Materials Science
  • Nanotechnology
  • Spectroscopy

Background:

  • Nanoscale device properties depend on atomic configurations.
  • Graphene's electronic properties are governed by its edge structures.
  • Atomic-level electronic state analysis is crucial but challenging for light elements like carbon.

Purpose of the Study:

  • To develop a method for site-specific single-atom spectroscopy.
  • To investigate the electronic and bonding structures of graphene edge atoms with atomic resolution.
  • To overcome limitations of weak signals and specimen damage in electron spectroscopy.

Main Methods:

  • Site-specific single-atom spectroscopy.
  • Energy-loss near-edge fine-structure (ELNES) analysis.
  • Transmission electron microscopy (TEM) and scanning tunneling microscopy (STM) were used for atomic configuration investigation.

Main Results:

  • Achieved site-specific single-atom spectroscopy at a graphene boundary.
  • Determined electronic and bonding structures of individual edge atoms.
  • Successfully discriminated between single-, double-, and triple-coordinated carbon atoms with atomic resolution.

Conclusions:

  • Demonstrated that rich chemical information can be obtained from single atoms using ELNES.
  • The developed technique enables direct investigation of local electronic structures in nanodevices and molecules.
  • This breakthrough paves the way for exploring atomic-level electronic properties in advanced materials.